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Page 57

May 20-21, 2019 | Vienna, Austria

Biomaterials and Nanomaterials &

Materials Physics and Materials Science

2

nd

International Conference on

Journal of Materials Science and Nanotechnology | Volume 3

Notes:

Some critical problems of the mechanical behavior and performance of electronic

and optical materials, assemblies and systems: Application of analytical

(“mathematical”) modeling

E Suhir

Portland State University, USA

S

ome critical problems of the mechanical behavior

and performance of electronic and optical materials,

assemblies and systems are addressed and discussed. It

is shown that application of analytical modeling (always

confirmed by finite-element-analyses) enables to reveal

and explain the underlying physics associated with such,

often non-obvious, always non-trivial and sometime

even paradoxical, problems and situations. Most of the

problems were encountered by the first author during his

tenure with Bell Labs (basic research area, Murray Hill,

NJ), University-of-California at Santa Cruz, Portland State

University at Portland, OR, and small business innovative

research (SBIR) ERS Co., USA. The following major

problems are addressed: magnitude and distribution of

the interfacial thermal stresses in adhesively bonded or

soldered assemblies; incentive for using low modulus

bonding materials and, in some cases, materials with low

yield stress; assemblies bonded at the ends; incentive

for using test specimens with transverse grooves in

the bonded materials for lower and more uniformly

distributed interfacial stresses; thermostatic compensation

in temperature-sensitive devices using conventional

materials (as opposite to ceramics with negative CTE);

bow-free (temperature change insensitive) assemblies;

thermal and lattice mismatch stresses in semiconductor

crystal grown assemblies; ability to adequately mimic drop

test conditions using shock testers; demonstration that

the maximum acceleration is not always the adequate

criterion of the dynamic strength of an electronic product,

and that a static short-term load could be more damaging

than the dynamic one; combined action of tensile and

bending deformations of the PCBs subjected to drop tests

and ability to obtain closed-form and even exact solutions

for highly nonlinear shock-excited vibrations, such as, e.g.,

those taking place during drop tests on the board level;

role of upper harmonics during drop tests; nonlinear

response of the rocket PCB (with surface-mounted

devices on it) to the sudden acceleration applied to its

support contour; modeling situations, when the dynamic

response of a linear or a non-linear electronic system

subjected to a short-time loading can be substituted with

an instantaneous impulse; stress relief in solder joints of

the second level of interconnections (package to PCB)

owing to larger stand-off heights of the solder joints;

incentive for using inhomogeneous solder joint systems

for lower thermally induced stresses; thermal stress in

flexible electronics; ability to predict the threshold of

the added transmission losses in jacketed (single coated)

optical fibers using mechanical considerations; incentive

for mechanical pre-stressing of accelerated test specimens

subjected to thermal loading; ability to relieve stress in

thermoelectric module designs using thinner and longer

legs; reducing bending stress in optical fiber interconnects

by properly rotating their ends; low-temperature micro-

bending of long-haul dual-coated optical fibers; two-

point bending of optical fiber specimens. It is concluded

that all the three basic approaches in microelectronics

and photonics materials science and engineering -

analytical (“mathematical”) modeling, numerical modeling

(simulation) and experimental investigations - are equally

important in understanding the physics of the materials

behavior and in designing, on this basis, viable and reliable

electronic devices and products. As to analytical modeling,

it is a powerful tool that enables one to explain critical

and often paradoxical situations in the behavior and

performance of electronic materials and products, and to

make a viable device into a reliable product.

e

:

suhire@aol.com