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July 23-25, 2018 | Moscow, Russia
Materials Science and Engineering
International Conference on
Journal of Materials Science and Nanotechnology | Volume 2
Technology at the nanoscale has become one of the main
challenges in science as new physical effects appear and
can be modulated at will. Materials for spintronics, electronics,
optoelectronics, sensing, energy applications and new
generations of functionalized materials are taking advantage of
the low dimensionality, improving their properties and opening
a new range of applications. As developments in materials
science are pushing to the size limits of physics and chemistry,
there is a critical need for understanding the origin of these
unique physical properties (optical and electronic) and relate
them to the changes originated at the atomic scale, eg: linked to
changes in (electronic) structure of the material. In the present
work, I will show how combining advanced electronmicroscopy
imaging with related spectroscopies in an aberration corrected
STEM will allow us to probe the elemental composition and
electronic structure simultaneously with the optical properties
in unprecedented spatial detail.The talk will focus on several
examples in advanced nanomaterials for optical, plasmonic
and energy applications. In this way the latest results obtained
by my group on direct visualizing and modeling materials at
atomic scale will help to understand their growth mechanisms
(sometimes complex) and also correlate their physical
properties (electronic and photonic) at sub-nanometer with
their atomic scale structure. The examples will cover a wide
range of nanomaterials: quantumstructures self-assembled in a
nanowire: quantumwires (1D) andquantumdots (0D) andother
complex nanowire-like morphologies for photonic and energy
applications (LEDs, lasers, quantum computing, single photon
emitters, water splitting cells, batteries), nanomembranes and
2D sheets.
Speaker Biography
Jordi Arbiol graduated in Physics at Universitat de Barcelona (UB) in 1997, where he
also obtained his PhD (European Doctorate and PhD Extraordinary Award) in 2001.
He was Assistant Professor at UB. From 2009 to 2015 he was ICREA Professor and
Group Leader at Institut de Ciència de Materials de Barcelona, ICMAB-CSIC. He is the
President of the Spanish Microscopy Society (SME), was the Vice-President from 2013
to 2017. Since 2015 he is ICREA Professor and the leader of the Group of Advanced
Electron Nanoscopy at Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC
and BIST. He has been awarded with the EU40 Materials Prize 2014 (E-MRS), the 2014
EMS Outstanding Paper Award and listed in the Top 40 under 40 Power List (2014) by
The Analytical Scientist. He has over 295 publications that have been cited over 10800
times, and his publication H-index is 57 (WoS), 66 (GoS)
e:
Arbiol J
Catalan Institute of Nanoscience and Nanotechnology, Spain
Free-Standing Nanostructures at atomic scale: From growth mechanisms to local properties